3.7V DIY晶体管图形测试仪液晶数字万用表二极管电感电容ESR表+外壳
$23.99
型号: EB0046824
80 销量
29 评论
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1. One key measurement operation, auto power off delay. Shutdown current is only 20nA, support for battery operation.
2. 自动测试 PNP 和 NPN 双极晶体管, N, P-channel MOSFET, JFET FET, diodes, two diodes, thyristors, resistors, capacitors, inductors.
3.Automatic test pin definitions.
4. Measuring the current amplification factor (B) of the bipolar transistor and the turn-on voltage of the emitter junction (Uf).
5. Darlington transistor amplification factor can be identified by the high threshold voltage and high current.
6.It can te bipolar transistors and MOSFET's internal protection diodes and displayed on the screen.
7. Measuring the threshold voltage and the gate capacitance of the MOSFET.
8. Support two resistance measurements, the potential can be measured. If the potentiometer is adjusted to its end, the tester can not distinguish between the middle and the ends of the pin.
9. Resistance measurement resolution is 0.1 ohms, the maximum value of 50M ohms measurements. Capacitance measurement range from 25pf to 100mF (10 UF).
10. Resolution up to 1 pF, inductance measurement range 0.01MH-20H, otherwise it will appear as a resistor, inductor DC resistance is higher than if Europe 2100 will also be displayed as a resistor.
11、可测试2UF以上电容等效串联电阻(ESR),分辨率0.01欧。
12. This feature is very important for the test of the capacitor performance.
13. Can display symbols of the two diodes in the right direction, also shows the forward voltage drop.
14. LED test for diode forward voltage drop higher than normal. Dual LEDs tested as double diode.
15. Simultaneous test of light-emitting diodes will flash. Time for each test is about two seconds, only the large capacitance and inductance measurements will take a long time.
更正:
Short three test side, into the test, the screen prompts correction step. When prompted to disconnect the short end of the calibration time off three tests will continue. When prompted in the 1-3 foot access 100nF capacitor over time, access to distribution after correction capacitors 1uF program will automatically enter the next step. Correction until the end of the restart to complete the correction.
The main parameters and use:
1. Using AT ATmega328 micro controller.
2. 2x16 character LCD display results.
3.One-button operation, automatic power off.
4. Shutdown current of only 20nA, support for battery operation.
5. Low-cost version without the crystal, auto power off. 1.05k version of the software ATmega168 or ATmega328 in sleep mode when no measurement to reduce power consumption.
6.自动测试 PNP 和 NPN 双极晶体管, N, P-channel MOSFET, JFET, diodes, dual diode, thyristor SCR.
7. Automatically tests the pin layout.
8. The threshold voltage and current amplification factor of the emitter junction of the bipolar transistor measurements.
9. Darlington transistor through a high threshold voltage and high-current amplification factor identified.
10. Pairs of bipolar transistors, MOSFET protection diode testing.
11. The threshold voltage value and the gate capacitance of a MOSFET is measured.
12. Supports two resistance measurements and symbols show the highest four numbers and units. Both ends of the resistor symbol is shown connected to the tester probes number (1-3). Therefore, the potential can also be measured. If the potentiometer is adjusted to its end, the tester can not distinguish between the middle and the ends of the pin.
13. Resistance measurement resolution is 0.1 ohms, the highest measured value 50M ohms.
14. Can be tested and measured a capacitor. Maximum four numbers and units. Values can be from 25pf (8MHz clock, 50pF @ 1MHz clock) to 100mF. Resolution up to 1 pF (@ 8MHz clock).
15. May be larger than the value for 2UF capacitor equivalent series resistance (ESR) measured capacitance value. Resolution of 0.01 ohms and a two-digit numeric display. This feature requires at least 16K Flash ATMEGA (ATmega168 or ATmega328).
16. Can display symbols of the two diodes in the right direction. In addition, the forward voltage drop displayed.
17. LED test for diode forward voltage drop is much higher than normal. Dual LEDs tested as double diode.
18.如果反向击穿电压小于4.5V。 这会表现为两个二极管,只能由电压决定。 探头周围的二极管符号是一样的,在这种情况下,可以700mV的阈值电压接近真正的识别二极管的阳极!
19. 如果检查超过三个二极管类型的零件,则建立二极管数量失败的另一个消息。 只有当二极管连接到所有三个探头和至少一个二极管时,才会发生这种情况。 在这种情况下,您应该只连接两个探头,然后一个接一个地重新开始测量。
20. 测量单个二极管的反向电容值。 如果连接基极和集电极或发射极,双极晶体管也可以测量。
21.需要找一个全桥接法的测量。
22. 测试时间大约是两秒,只是电容和电感的测量需要更长的时间。
23.软件可设置自动关机前测量次数。
24. 内置自检功能,可选择50Hz信号时钟频率,检查精度并等待调用(ATmega168和ATmega328)。
25. 可选电阻和零偏校准测量设备端口输出的自检能力(ATmega168和ATmega328)。 需要连接一个 100nF 到 20uF 的电容来补偿模拟比较器引脚 1 和 3 之间的偏移电压。 这可以将电容器的测量误差降低 40uF 以上。 用相同的内部校准电容电压参考电压找到内部调整参考测量ADC增益。
26、如果测试电流超过保持电流,可以测试晶闸管和可控硅。 但有些电流高于半导体可控硅和可控硅测试仪可以提供触发电流。 可用测试电流仅为6mA左右! 注意所有函数都只使用了单片机程序存储器作为更多的ATmega168。
套餐包括:
1 x 带外壳的晶体管图形测试仪
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描述:
本测试仪采用3.7V可充电锂电池(电池型号:14500)供电便携设计,但您可以使用T-MINIUSB插座为电池充电并为系统长时间供电,在室内使用更加经济方便,省去了 需要随时更换电池的经济投入。
本测试仪采用3.7V可充电锂电池(电池型号:14500)供电便携设计,但您可以使用T-MINIUSB插座为电池充电并为系统长时间供电,在室内使用更加经济方便,省去了 需要随时更换电池的经济投入。
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2023-03-03
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